Scanning Electron Microscopy

Scanning electron microscopy (SEM) uses electrons instead of visible light resulting in a significantly increased resolution.

Infrastructure: Philips XL30 ESEM, SED (secondary electron detector), BSED (back scattered electron detector), various ESEM detectors (GSED, ESD)

Trichome on the leaf of lavender
Trichome on Pinguicula sp. (leaf)